Probe Enables Surface-Finish Measurement on CMMs

Renishaw’s SFP1 probe option for the Revo five-axis measurement system integrates surface-finish inspection within coordinate measurement routines.

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Renishaw’s SFP1 probe option for the Revo five-axis measurement system integrates surface-finish inspection within coordinate measurement routines. With a measurement capacity of 6.3 to 0.05 Ra, the probe is designed to eliminate the need to use handheld surface-measurement devices or move parts to dedicated surface-measurement machines. The system enables automated switching between dimensional and surface-finish measurement, with the analysis contained in a single report.

The probe is supplied with dedicated straight and cranked styli that are selected with the measurement program control using the system’s modular rack system (MRS). The skidded probe features a 2-micron (0.000079") radius diamond stylus tip, and the C axis enables automatic orientation of the tip to any angle to suit the part.

The probe outputs Ra, RMS and raw data formats to the metrology application software via Renishaw’s UCCServer software using the I++ DME protocol. The raw data can be presented to specialized surface-analysis programs for more detailed reporting. Calibration is automated under the CMM program. A surface-finish calibration artifact mounted on the MRS rack is measured using the SFP1 probe. Software adjusts parameters within the probe in accordance with the artifact’s calibrated value.

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