Two High Precision Measuring Systems Into One

The new MarSurf XCR 20 combines two high precision measuring systems into one, enabling both roughness and contour measurements to be taken on the same unit and with the same setup. The combined measuring station incorporates drive units from the MarSurf XR 20 roughness and XC 20 contour systems. The MarSurf GD 25 roughness drive unit (XR 20) and PCV 200 contour drive unit (XC 20) are attached via a twin mount to the same measuring stand.

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The new MarSurf XCR 20 combines two high precision measuring systems into one, enabling both roughness and contour measurements to be taken on the same unit and with the same setup. The combined measuring station incorporates drive units from the MarSurf XR 20 roughness and XC 20 contour systems.

The MarSurf GD 25 roughness drive unit (XR 20) and PCV 200 contour drive unit (XC 20) are attached via a twin mount to the same measuring stand. There is no need to change the drive unit or probe when changing the measurement task from roughness to contour.

The XCR 20 also allows certain operating sequences, such as measuring stand positioning and drive unit positioning, to be semi-automated. Simulation modes allow users to quickly familiarize themselves with both systems, and "teach-in" commands allow the creation of "quick and easy" measuring programs that can be saved and launched using programmable function keys.

 

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