LK Metrology Bridge-Type CMMs Enable Precise Measurement of Large, Heavy Components

LK Metrology’s Maxima and Maxima R bridge-type coordinate measuring machines (CMMs) are designed for precise measurement of large, complex, heavy components. The machines are well-suited for quality control applications across industries such as aerospace, energy, automotive, heavy engineering, power generation, transportation and industrial machinery.

LK Metrology’s advanced ceramic materials for the beam and spindle guideways, which provide a high stiffness-to-weight ratio, have been combined with a robust structure for consistent accuracy and repeatable results down to 3 μm. Low gap, high-efficiency air bearings and drive systems provide high quality and low maintenance.

The Maxima series offers what the company says is the largest measurement volume on the market, from 12-72 m³, of any CMM with a granite table. The series is designed to maintain performance even when supporting the heaviest workpieces. Included in the range are 28 models in six table lengths from 3-8 m and seven variants of bridge cross section up to 3 m.

The Maxima R range features a twin-rail design engineered for heavyweight workpieces. The structure enables safe and efficient loading of heavy components on the floor and seamless integration with automated transfer systems. A key advantage of these models is that the design eliminates the need for specialized foundations while offering stability, simplified installation and cost efficiency. The Maxima R is available in the same range of sizes as the table-type models.

Both CMM product lines are equipped with an LK controller and are available in several configurations: either probe-ready for tactile inspection and laser scanning using a PH10MQ Plus multisensor indexing probe head with autojoint, or in a ScanTek configuration with a multisensor Revo2 head to provide five-axis scanning, or with an SP80 fixed scanning head with probe builds up to 1 m. The PH10MQ-ready models feature a multiwire cable that supports both SLK and L/LC/XC laser scanner technologies, eliminating the need for a separate probe-ready configuration for each type.