SFP2 Probe Increases Surface Finish Measurement Ability

Originally titled 'Probe Increases Surface Finish Measurement Ability'

Renishaw’s SFP2 surface finish measurement is powered by five-axis measurement technology and is automatically interchangeable with all other probe options available for Revo. 

Renishaw’s SFP2 surface finish measurement probe increases the surface finish measurement ability of the Revo five-axis measurement system, which offers a multi-sensor capability providing touch-trigger, high-speed tactile scanning and non-contact vision measurement on a single CMM.

Combining surface finish measurement and dimensional inspection on the CMM presents advantages over traditional inspection methods requiring a separate process. Powered by five-axis measurement technology, the probe’s automated surface finish inspection offers time savings, reduced part handling and greater return on CMM investment.

The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for Revo. This provides the flexibility to select the optimum tool to inspect a range of features on the same CMM platform. Data from multiple sensors is automatically referenced to a common datum.