SFP2 Probe Increases Surface Finish Measurement Ability
Appears in Print as: 'Probe Increases Surface Finish Measurement Ability'
Renishaw’s SFP2 surface finish measurement is powered by five-axis measurement technology and is automatically interchangeable with all other probe options available for Revo.
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Renishaw’s SFP2 surface finish measurement probe increases the surface finish measurement ability of the Revo five-axis measurement system, which offers a multi-sensor capability providing touch-trigger, high-speed tactile scanning and non-contact vision measurement on a single CMM.
Combining surface finish measurement and dimensional inspection on the CMM presents advantages over traditional inspection methods requiring a separate process. Powered by five-axis measurement technology, the probe’s automated surface finish inspection offers time savings, reduced part handling and greater return on CMM investment.
The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for Revo. This provides the flexibility to select the optimum tool to inspect a range of features on the same CMM platform. Data from multiple sensors is automatically referenced to a common datum.
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