Surfcom Systems Handle Different Measurement Attributes
An entry-level portable model with three small tracing drivers handles measurements with different attributes.
Zeiss Industrial Metrology introduced a line of surface roughness inspection systems. Surfcom Touch, an entry-level portable model with three small tracing drivers handles measurements with different attributes. For surface and roughness measurements in one portable, compact system, the Surfcom Touch 50 is especially useful , the company says. A desktop Surfcom Touch 550 system is offered for high accuracy inspection of large parts. The transportable systems are available with three small and light skidded tracing drivers for various measurement types. These machines inspect horizontal and vertical surfaces in narrow areas with a transverse trace.
The 50 model offers skidless measurement with a high-performance pickup, high resolution and a wide measuring range. Various workpieces can be measured by changing out the stylus for deep, long or small holes or a round surface. This model offers a large measuring range (50-mm X axis) and high resolution (0.1 nm) in one system.
The high-performance pickup of the 550 model has a measurement range as high as 1,000 micrometers and a Z-axis minimum resolution of 0.0001 micrometer. In addition to flat surfaces, the roughness or waviness on undulating surfaces such as stepped or round surfaces can be evaluated with one trace.
The product line has several touch screen options. An amplifier with a 7-inch-wide touch panel and a new interface provides easy operation, eliminating the need for instructions, the company says.
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